Tag Archives: PXI

PICMG Improves, Upgrades CompactPCI Express Specification

PICMG introduced a new revision and upgrade to the CompactPCI Express specification, Revision 2. This revision of CompactPCI Express features interoperability at both the interface and product level, and increase performance. The latest specification will allow rapid adoption in instrumentation and control applications where performance and interoperability are critical. The PXI standard, which currently builds on top of CompactPCI and CompactPCI Express, will see immediate benefit from the new revision.

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NI Introduces 10 New PXI Products for Mixed-Signal Semiconductor Test

National Instruments (Nasdaq: NATI) introduced 10 new PXI products that expand the capabilities of PXI for mixed-signal semiconductor test. The suite of new software-defined products, which are optimized for use with NI LabVIEW graphical system design software, includes four high-speed digital I/O (HSDIO) instruments, two digital switches, two enhanced RF instruments, a high-precision source measure unit (SMU) and specialized digital vector file importing software. The new NI PXI Semiconductor Suite incorporates numerous new features including 200 MHz single-ended digital I/O, 10 pA current resolution, rapid multiband RF measurements, DC/digital switching and Waveform Generation Language (WGL) and IEEE 1450 Standard Test Interface Language (STIL) file importing capability.

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