Tag Archives: AFM

Bruker Announces Photoconductive Atomic Force Microscopy Module

Bruker Photoconductive Module for the Dimension Icon Atomic Force Microscope (AFM)

Bruker introduced the Photoconductive Module for the Dimension Icon Atomic Force Microscope (AFM). The Photoconductive Atomic Force Microscopy (pcAFM) enables sample illumination while performing nanoscale electrical characterization. Bruker’s pcAFM accessory transforms the Dimension Icon AFM into a solution for dedicated nanoscale organic photoelectric material research.

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Bruker Debuts InSight-450 3DAFM, D8 FABLINE, S8 FABLINE-T Metrology Tools

Bruker introduced three new 450mm X-Ray and AFM semiconductor metrology products: InSight-450 3DAFM, D8 FABLINE and S8 FABLINE-T X-ray systems. The three metrology systems are designed to meet the industry roadmap challenges at future technology nodes on the larger 450mm wafer size. They enable both greater product capability and reliability for semi development and production facilities.

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