Intellitech Introduces UltraTAP-BT Bluetooth IEEE 1149.1 / JTAG Pod
Intellitech Corporation, the leader in lowering electronic product costs through IEEE 1149.1/JTAG, has announced UltraTAP-BT, a Bluetooth enabled IEEE 1149.1/JTAG pod with non-volatile test program and failure memory. The Bluetooth wireless capability brings the convenience, ease-of-use and low cost appreciated in consumer products to IEEE 1149.1/JTAG test. The UltraTAP-BT is designed to allow plug-n-play test and FPGA configuration without a computer, cable and software. 1149.1/JTAG based tests are executed from the UltraTAP-BT Flash memory. Since there is no software overhead or PC bus architecture, tests execute at a continuous test clock rate of up to fifty megahertz. Failures are stored for retrieval via a Bluetooth enabled device. The autonomous operation of the UltraTAP-BT enables new capabilities and lower cost for 1149.X based test during PCB bring-up, manufacturing, burn-in and field-service. One Bluetooth enabled PC can control multiple pods, breaking the traditional "one PC software, one pod" model used in 1149.1/JTAG test.
Microchip Launches MPLAB ICD 3 High-Speed In-Circuit Debugger
Microchip Technology Inc., a leading provider of microcontroller and analog semiconductors, announced from the Embedded Systems Conference in Boston the MPLAB® ICD 3 — a cost-effective, high-speed development tool that supports in-circuit programming and debugging of Microchip's Flash-based 8-bit PIC® microcontrollers (MCUs), and its entire line of 16- and 32-bit MCUs and 16-bit dsPIC® Digital Signal Controllers (DSCs). With robust system capabilities and high-speed circuitry, the MPLAB ICD 3 offers full compatibility with the MPLAB Integrated Development Environment (IDE), exceptional programming speed and reliability.
Hitachi Lowers Manufacturing Cost with Cadence Encounter Test
Cadence Design Systems, Inc. (NASDAQ: CDNS), the leader in global electronic design innovation, announced that its unique test technologies have enabled Hitachi Ltd., in the hardware domain of Information & Telecommunication Systems, to cost-effectively produce high-performance large scale integrated circuit (LSI) devices in volume with the lowest number of test escapes or defects achieved by Hitachi to date. By combining Cadence® Encounter® Test pattern-fault modeling with the state-of-the-art test pattern generation, compression technology and diagnostics, Cadence helps Hitachi ensure that these complex, high-performance LSI devices work as designed.
Teradyne, JTAG Technologies Team on Advanced Digital Networks Test
Teradyne, Inc. (NYSE: TER) and JTAG Technologies have jointly demonstrated the ability to test and diagnose advanced digital networks with an integrated boundary-scan solution running on the Teradyne(R) TestStation(TM). This means that TestStation users can expand the test coverage achieved via boundary-scan on their boards to include such networks as LVDS, AC-coupled, and others.
ASSET Becomes Member of Synopsys in-Sync Program
ASSET®, the leading supplier of open tools for embedded instrumentation, has joined Synopsys' in-SyncT program for third-party suppliers of EDA-related products. Synopsys is a world leader in software and IP for semiconductor design and manufacturing. This step marks a significant advance towards ASSET's commitment to deliver technology for embedded instrumentation tools.
Measurement Computing Launches 14 New USB Data Acquisition Devices
Measurement Computing announced 14 new high-performance, multifunction, and special purpose USB-based data acquisition products, targeting applications requiring high-accuracy, measurement repeatability, and high throughput. The list includes: high-channel-count and high-accuracy analog input and thermocouple measurement devices; several high-speed, simultaneous sampling, multifunction devices; and an eight-channel, simultaneous input quadrature encoder counter.
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