ASSET InterTech RIC-1000 Controller Conducts Test Over Internet
The new Remote Instrumentation Controller family from ASSET® InterTech is the industry's first to apply JTAG/boundary scan tests directly over the Internet. The first member of the family, the RIC-1000 controller, connects locally to a circuit board or other unit under test (UUT) and remotely over Ethernet to an ASSET ScanWorks® embedded instrumentation platform. ASSET is the leading supplier of open tools for embedded instrumentation.
Intellitech Unveils Scan Ring Linker Multi-voltage JTAG Multiplexer
Intellitech Corporation, the leader in lowering electronic product costs through IEEE 1149.1/JTAG, has announced that it has shipped a new multi-voltage eight ring JTAG multiplexer called the Scan Ring Linker in a 16mm x 16mm VQ100 package to early adopters. The SRL lowers PCB costs and reduces engineering design time by eliminating pull-up/pull-down resistors, buffer ICs and voltage translators needed for designing and routing JTAG rings in complex PCBs and Systems, especially those with mezzanine cards.
Corelis Rolls Out ScanExpress Boundary-Scan Tool Suite 6.6
Corelis Inc., a leading supplier of high-performance boundary-scan and JTAG functional emulation test tools, announced that Corelis has just released the latest version of its powerful ScanExpress Boundary-Scan Tool Suite. The new Version 6.6 now combines ScanExpress JET with the uniquely expanded capabilities of both ScanExpress TPG test development and ScanExpress Runner test execution software. These developments represent a quantum leap in automatic circuit board testing.
pls Releases Universal Debug Engine 2.4 at electronica 2008
pls Programmierbare Logik & Systeme presents the latest version of its Universal Debug Engine (UDE) 2.4 at electronica 2008 in Area A6, Both S02. The UDE 2.4 also immediately supports NXP Semiconductor's new LPC32×0 microcontroller family, which is designed for demanding industrial, consumer, medical and network applications.
ASSET InterTech Drives Development of IEEE 1149.7 Standard
ASSET® InterTech, the leading supplier of open tools for embedded instrumentation, has assumed a principal role in the development of IEEE 1149.7 as one of the founding members of the working group that is defining the emerging standard, which will be ratified in early 2009. Deriving from an established standard, the IEEE 1149.1 Test Access Port (TAP) and Boundary-scan Architecture, but offering options for a smaller, two-wire interface and enhanced functionality, IEEE 1149.7 extends the test and debug capabilities of IEEE 1149.1 standard's TAP to complex devices like system-on-chip (SOC), system-in-package (SIP), and other multi-core or multi-die devices. In its reduced pin count form factors, IEEE 1149.7 has been targeted for mobile products, but it offers enhanced test functionality for any electronic system.
Race Technology Rolls Out SPEEDBOX2 High Accuracy Speed Sensor
The SPEEDBOX2 is the successor to Race Technology's highly regarded SPEEDBOX which is already used by many automotive OEMs and vehicle testing organisations worldwide. The SPEEDBOX2 is a high accuracy, low latency GPS and inertial transducer suitable for interfacing with a wide range of data acquisition and logging systems. Primarily, the SPEEDBOX2 is used to measure speed and distance travelled, however other outputs include position, gradient, heading and acceleration. Modular add-ons are also available to allow measurement of vehicle roll, pitch and yaw angles and rotation rates.
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