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'Test Solution' Category Archive

Ebook: Functional Test on I2C and SPI System Monitors with JTAG

Posted by Ken Cheung in Research,Test Solution on Friday, May 10, 2013

Functional Test on I2C and SPI System Monitors with JTAG ebook

ASSET InterTech published an ebook about JTAG. The article describes how the structural test methodology based on the IEEE 1149.1 boundary scan standard can apply functional tests to I2C and SPI system monitors during prototype board bring-up and later during production of the circuit board. The title of the technical paper is: Functional Test on I2C and SPI System Monitors with JTAG.

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ADLINK Debuts USB-7230, USB-7250 Isolated USB Digital I/O Modules

Posted by Ken Cheung in Test Solution on Friday, January 25, 2013

ADLINK Technology USB-7230 and USB-7250 isolated USB digital I/O modules

ADLINK Technology introduced their USB-7230 and USB-7250 isolated USB digital I/O modules. The USB-7230 features 32-CH isolated digital I/O and 2-CH frequency/event counters, while the USB-7250 provides 8-CH solid-state relay output (4 form C and 4 form A), 8-CH isolated DI, and 2-CH frequency/event counters. The USB form factor DAQ/DIO products are ideal for high voltage control and monitoring applications.

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DELTA Microelectronics Selects Test Insight to Improve Design to Test Flows

Posted by Ken Cheung in Test Solution on Friday, January 11, 2013

Test Insight Tester Data Link

Test Insight, a world leader in software tools for linking design to test and managing ATE programs, announced that the microelectronics division of DELTA, a European leader of value-added ASIC services, has adopted Tester Data Link to improve design to test flows while at the same time offering improved services to customers.

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Data Translation Introduces DT9847 USB Dynamic Signal Analyzers

Posted by Ken Cheung in Test Solution on Tuesday, November 20, 2012

Data Translation DT9847 Series high-accuracy, dynamic signal acquisition modules for USB

Data Translation introduced the DT9847 Series high-accuracy, dynamic signal acquisition modules for USB. The DT9847 features an ultra-low total harmonic distortion (THD) of 102dB. It also offers a 123dB dynamic range for low to high level precise signal measurement without any gain ranging. The DT9847 Series will be available this month. Prices start at $1595.

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API Technologies Unveils XL403D Advanced Digital Accelerometer

Posted by Ken Cheung in Test Solution on Thursday, October 25, 2012

API Technologies XL403D Advanced Digital Accelerometer

API Technologies introduced their XL403D Advanced Digital Accelerometer. The patent pending accelerometer evaluates minimum/maximum, magnitude, peak-to-peak, and tilt right in the accelerometer itself. The XL403D is the first accelerometer to support SCPI-like commands, returns data in engineering units, and works with any standard terminal emulator.

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Owon SmartDS 5032E Oscilloscope Features Two Channels, 30MHz Bandwidth

Posted by Ken Cheung in Test Solution on Wednesday, August 29, 2012

Owon SmartDS 5032E oscilloscope

Saelig introduced the Owon SmartDS 5032E oscilloscope. The SDS5032E features manual cursor measurements, up to 19 automatic measurements (including frequency), high-speed screen update, storage for up to 15 waveforms and set-up parameters, convenient USB serial interface with PC software, and advanced trigger settings including pulse width criteria for detecting rogue signals. The two-channel oscilloscope is available now for $299.

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Mantracourt Introduces T24-GW1 Modbus Gateway for Gathering Data Wireless

Posted by Ken Cheung in Test Solution,Wireless on Tuesday, August 21, 2012

Mantracourt T24-GW1 Wireless Telemetry Modbus Gateway

Mantracourt introduced the T24-GW1 Modbus Gateway. The T24-GW1 is a Modbus interface gateway with a simple interface for gathering data from up to 100 acquisition modules in a T24 network using either the standard Modbus interface RTU protocol or a simple ASCII protocol. Simple commands are available to wake, sleep, and keep awake T24 acquisition modules. The Mantracourt T24-GW1 is ideal for process control, industrial processing, chemical manufacturing, pharmaceuticals and automotive applications.

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Bruker Announces Photoconductive Atomic Force Microscopy Module

Posted by Ken Cheung in Equipment,Test Solution on Monday, August 20, 2012

Bruker Photoconductive Module for the Dimension Icon Atomic Force Microscope (AFM)

Bruker introduced the Photoconductive Module for the Dimension Icon Atomic Force Microscope (AFM). The Photoconductive Atomic Force Microscopy (pcAFM) enables sample illumination while performing nanoscale electrical characterization. Bruker’s pcAFM accessory transforms the Dimension Icon AFM into a solution for dedicated nanoscale organic photoelectric material research.

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Lantronix Introduces xSenso Analog Device Server

Posted by Ken Cheung in Test Solution on Wednesday, August 8, 2012

Lantronix xSenso Analog Device Server (ADS)

Lantronix launched their xSenso analog device server (ADS). xSenso enables sensors with analog outputs to send real-time data to any node on the network or over the Internet. The device remotely monitors and logs data from a variety of sensors — including temperature, humidity, pressure, level, flow, weight, and gas/air quality transmitters. xSenso can be IN-rail or wall mounted. It is available now for $235.

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White Paper: How to test high-speed memory with non-intrusive embedded instruments

Posted by Ken Cheung in Research,Test Solution on Tuesday, July 24, 2012

How to test high-speed memory with non-intrusive embedded instruments white paper

ASSET InterTech published a new white paper about non-intrusive embedded instruments. The technical paper explains how non-intrusive software-driven embedded instruments can overcome many of the challenges of testing, validating and debugging high-speed memory buses such the DDR 3 or DDR4 (DDR3/4) buses, and others. The title of their article is “How to test high-speed memory with non-intrusive embedded instruments.”

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