Category Archives: Test Solution

test sloutions, qa, test, measure

LDRA Introduces LDRAunit for Automating Unit Tests

LDRA LDRAunit integrated framework for automating the generation and management of unit tests

LDRA announced the LDRAunit integrated framework for automating the generation and management of unit tests. It is a comprehensive and cost-effective host/target test generation and management solution for the C, C++, Ada, and Java languages. The tool takes over the tedious, error-prone process of manually developing a test harness simply by analyzing the code, generating tests, and applying a range of parameters that ensure against conditions that can cause unexpected results.

Continue reading

eBook: Faster Firmware Debug with Intel Embedded Trace Tools

Faster Firmware Debug with Intel Embedded Trace Tools eBook | ASSET InterTech

ASSET InterTech published a new eBook. The publication discusses how hardware-assisted debugging tools are able to tap into the embedded trace resources in Intel processors to methodically and quickly track bugs through the interrelated web of software, firmware and hardware. The title of the paper is: Faster Firmware Debug with Intel Embedded Trace Tools.

Continue reading

New eBook: Testing DDR3 Memory Boundary Scan JTAG

Testing DDR3 Memory Boundary Scan JTAG eBook | ASSET InterTech

ASSET InterTech published a new eBook. The publication explains how to test DDR memory with non-intrusive JTAG or boundary-scan (IEEE 1149.1) methods. The title of the paper is Testing DDR3 Memory Boundary Scan JTAG. The paper was written by Kent Zetterberg, product manager, ASSET InterTech.

Continue reading

White Paper: Weigh Your Instrumentation Options, Switch, Transmitter or Hybrid?

SOR recently published a white paper about selecting the right instrumentation for the job. The article presents three questions to help the engineers determine the best instrumentation for the application. The technical paper is titled, Weigh Your Instrumentation Options, Switch, Transmitter or Hybrid?

Continue reading

Ebook: Functional Test on I2C and SPI System Monitors with JTAG

Functional Test on I2C and SPI System Monitors with JTAG ebook

ASSET InterTech published an ebook about JTAG. The article describes how the structural test methodology based on the IEEE 1149.1 boundary scan standard can apply functional tests to I2C and SPI system monitors during prototype board bring-up and later during production of the circuit board. The title of the technical paper is: Functional Test on I2C and SPI System Monitors with JTAG.

Continue reading

ADLINK Debuts USB-7230, USB-7250 Isolated USB Digital I/O Modules

ADLINK Technology USB-7230 and USB-7250 isolated USB digital I/O modules

ADLINK Technology introduced their USB-7230 and USB-7250 isolated USB digital I/O modules. The USB-7230 features 32-CH isolated digital I/O and 2-CH frequency/event counters, while the USB-7250 provides 8-CH solid-state relay output (4 form C and 4 form A), 8-CH isolated DI, and 2-CH frequency/event counters. The USB form factor DAQ/DIO products are ideal for high voltage control and monitoring applications.

Continue reading

DELTA Microelectronics Selects Test Insight to Improve Design to Test Flows

Test Insight Tester Data Link

Test Insight, a world leader in software tools for linking design to test and managing ATE programs, announced that the microelectronics division of DELTA, a European leader of value-added ASIC services, has adopted Tester Data Link to improve design to test flows while at the same time offering improved services to customers.

Continue reading

Data Translation Introduces DT9847 USB Dynamic Signal Analyzers

Data Translation DT9847 Series high-accuracy, dynamic signal acquisition modules for USB

Data Translation introduced the DT9847 Series high-accuracy, dynamic signal acquisition modules for USB. The DT9847 features an ultra-low total harmonic distortion (THD) of 102dB. It also offers a 123dB dynamic range for low to high level precise signal measurement without any gain ranging. The DT9847 Series will be available this month. Prices start at $1595.

Continue reading

API Technologies Unveils XL403D Advanced Digital Accelerometer

API Technologies XL403D Advanced Digital Accelerometer

API Technologies introduced their XL403D Advanced Digital Accelerometer. The patent pending accelerometer evaluates minimum/maximum, magnitude, peak-to-peak, and tilt right in the accelerometer itself. The XL403D is the first accelerometer to support SCPI-like commands, returns data in engineering units, and works with any standard terminal emulator.

Continue reading

Owon SmartDS 5032E Oscilloscope Features Two Channels, 30MHz Bandwidth

Owon SmartDS 5032E oscilloscope

Saelig introduced the Owon SmartDS 5032E oscilloscope. The SDS5032E features manual cursor measurements, up to 19 automatic measurements (including frequency), high-speed screen update, storage for up to 15 waveforms and set-up parameters, convenient USB serial interface with PC software, and advanced trigger settings including pulse width criteria for detecting rogue signals. The two-channel oscilloscope is available now for $299.

Continue reading