ASSET InterTech published an ebook about JTAG. The article describes how the structural test methodology based on the IEEE 1149.1 boundary scan standard can apply functional tests to I2C and SPI system monitors during prototype board bring-up and later during production of the circuit board. The title of the technical paper is: Functional Test on I2C and SPI System Monitors with JTAG.
Functional Test on I2C and SPI System Monitors with JTAG Topics
- Prototype Board bring-up without OS
- Structural and functional test in one step
- Testing System monitors: a real world example
The eBook explains how a method based on device models can simplify and accelerate the development of functional tests for I2C and SPI monitors. These same routines can also program monitoring devices with their operating code.
JTAG-based functional tests can be deployed early during design when prototypes are being brought up so that both structural and functional defects can be detected in one step. These same routines can migrate with the circuit board design when it transitions into volume manufacturing, eliminating the need to re-develop some of the board’s production tests. This reduces test costs, accelerates a new product’s time-to-market, and improves fault coverage and diagnostics in manufacturing.