Bruker Announces Photoconductive Atomic Force Microscopy Module

Bruker Photoconductive Module for the Dimension Icon Atomic Force Microscope (AFM)

Bruker introduced the Photoconductive Module for the Dimension Icon Atomic Force Microscope (AFM). The Photoconductive Atomic Force Microscopy (pcAFM) enables sample illumination while performing nanoscale electrical characterization. Bruker’s pcAFM accessory transforms the Dimension Icon AFM into a solution for dedicated nanoscale organic photoelectric material research.

The Dimension Icon pcAFM accessory is a modular addition to the Dimension Icon platform designed to retain the system’s top levels of performance while enabling photoconductivity measurements on organic light emitting diode (OLED), organic photovoltaic (OPV) and other photoelectric materials. It provides uniform backside sample illumination and can be fiber coupled to industry-standard solar simulators.

The Photoconductive Module builds on Bruker’s PeakForce TUNA technology to provide high resolution data advancing organic photoelectric material research. The pcAFM module enables highest resolution photoconductivity and correlated nanomechanical mapping for research on fragile organic light emitting diode and organic photovoltaic device samples.

The pcAFM module is compatible with Bruker’s turnkey 1ppm glove box configuration. It can handle the most stringent environmental control needs of organic photoelectric materials. The pcAFM accessory ensures that measurements are not compromised by environmental material degradation.

More info: Photoconductive Atomic Force Microscopy (pdf)