IEEE 1450.6.1 Standard for On-Chip Scan Compression Receives Approval

The IEEE has approved a new standard, IEEE 1450.6.1[TM], “Standard for Describing On-Chip Scan Compression.” This important standard for Integrated Circuit (IC) test is also known as the Open Compression Interface (OCI). It was initially created within the Accellera standards-setting organization and was transferred to the IEEE following Accellera’s ratification.

OCI defines how information is passed from scan insertion to pattern generation and from pattern generation to diagnosis, allowing tools from different vendors to be used regardless of what on-chip scan compression logic is used. It describes on-chip scan compression structures, operation, and connectivity which promote EDA tool interoperability for pattern generation and diagnosis.

“The approval of IEEE 1450.6.1 opens up opportunities for chip manufacturers, design automation and the makers of automated test equipment,” says Bruce D. Cory, chair for the IEEE working group which shepherded the standard. “After on-chip scan compression was developed, each vendor had their own, different set of methods to pass necessary information from scan insertion to pattern generation and from pattern generation to diagnosis. This created significant competitive barriers. Now this standard allows the test industry to use a variety of tools, regardless of what on-chip scan compression logic was used.”

“Electronic design industry participants worked together as part of our Accellera Technical SubCommittee to improve design and test tool interoperability, and to develop and achieve approval for our newest IEEE standard, IEEE 1450.6.1, which helps improve and reduce the costs of on-chip testability and manufacturing,” adds Shrenik Mehta, Accellera chair. “The new standard helps make it possible to test silicon even if an IC design or its embedded intellectual property was developed using different design and test software.”

For more information on Accellera’s standards, please visit www.accellera.org.

IEEE 1450.6.1 was sponsored by the Test Technology Committee of the IEEE Computer Society.

About the IEEE Standards Association
The IEEE Standards Association, a globally recognized standards-setting body, develops consensus standards through an open process that engages industry and brings together a broad stakeholder community. IEEE standards set specifications and best practices based on current scientific and technological knowledge. The IEEE-SA has a portfolio of over 900 active standards and more than 400 standards under development.

About IEEE
IEEE (Institute of Electrical and Electronics Engineers, Inc.), the world’s largest technical professional society, is commemorating its 125th anniversary in 2009 by “Celebrating 125 Years of Engineering the Future” around the globe. Through its more than 375,000 members in 160 countries, IEEE is a leading authority on a wide variety of areas ranging from aerospace systems, computers and telecommunications to biomedical engineering, electric power and consumer electronics. Dedicated to the advancement of technology, IEEE publishes 30 percent of the world’s literature in the electrical and electronics engineering and computer science fields, and has developed over 900 active industry standards. The organization annually sponsors more than 850 conferences worldwide.