JTAG Technologies, a leading world-wide provider of IEEE std. 1149 compliant boundary-scan products, has introduced the JT 37×7/RMI, a Rack Mount Instrument which combines a boundary-scan controller and a 256 channel I/O tester – all in a compact 1U x 19″ enclosure. Developed in response to customer demand, the JT 37×7/RMI features the full capability of JTAG Technologies’ renowned ‘DataBlaster’ boundary-scan controller, including: PCB testing plus flash and PLD device in-system programming. These features, combined with the company’s flexible Digital I/O Scan (DIOS) technology offers users a one-stop-shop for JTAG/boundary-scan test of complex boards and systems.
James Stanbridge, JTAG Technologies’ Sales Manager UK, comments: “Often test coverage of a boundary-scan compatible design is compromised if the native boundary-scan test access is limited. With our rack mount instrument we are able to ‘redress the balance’ by artificially adding boundary-scan test access where required. Also, since the RMI is platform-independent it is equally at home within PXI-, VXI- and PCI-based testers.”
The RMI can interface to the host computer through one of three standard formats, namely USB 2.0, Ethernet 10/100 and IEEE 1394 Firewire. Test clock frequency is programmable up to 40 MHz, allowing rapid application execution, especially important for flash programming, while TAP voltages can be set for a wide range of input and output characteristics. By connecting to a Unit Under Test (UUT), via edge connector or fixture test pins, the rack-mount instrument can not only control the boundary-scan compliant logic on the UUT but it can also interface simultaneously to connectors or test pads/lans to enhance both interconnect and so-called ‘logic cluster’ tests.
Stanbridge continues: “The new JT 37×7/RMI provides a ‘best-of-both-worlds’ solution when it comes to implementing JTAG/boundary-scan in a production environment. For example, a target circuit board may contain elements, such as board-edge connectors and non-boundary-scan logic clusters, which cannot be accessed directly by the native boundary-scan on the unit under test. In such cases, the overall testability of the board is diminished, allowing some manufacturing faults to go undetected. The DIOS channels within the JT 37×7/RMI overcome this problem by extending the reach of boundary-scan to include the testing of circuit board edge connectors and by providing extra test points internal to the PCB to improve fault coverage.”
To allow simpler integration into test racks and associated fixtures the system is packaged in an industry-standard 1U x 19″ form-factor, and any of its four JTAG/boundary-scan Test Access Ports (TAPs) can be extended from the RMI and embedded within a fixture for optimum signal integrity.
Both output and input voltage thresholds can be programmed to 1.5, 1.8, 2.5 or 3.3V making it ideally suited to the testing of modern low-voltage logic families. The I/O channels are individually programmable as input, output, bi-directional or tri-state signals, and are grouped into blocks of 16. To reduce scan chain length and improve test efficiency, any number of 16-channel groups can be bypassed.
Selected channels can be interfaced with custom cabling to the UUT (low volume apps) or interfaced with bed-of-nails fixtures for higher volume production.
The new RMI controller is fully compatible with all JTAG Technologies’ development tools and works seamlessly with de facto standards such as National Instruments’ LabVIEW, LabWindows and TestStand as well as custom C/C++ and Visual Basic test systems.
Stanbridge concludes: “Existing JTAG Technologies’ users will benefit from 100% pin compatibility between the JT 37×7/RMI and current instruments and accessories. What’s more, the RMI has been designed and is supported by the market leading and longest established JTAG/boundary-scan company in the business.”
The JT 37×7/RMI is available immediately from JTAG’s UK sales office.
About JTAG Technologies
JTAG Technologies is a market leader and technology innovator of boundary-scan software and hardware products and services. The company was the first to bring to the market such important advances as automated test generation, automated fault coverage analysis, automated flash and PLD programming via boundary-scan, and visualized boundary-scan analysis. Its customers include world leaders in electronics design and manufacturing such as Ericsson, Flextronics, Honeywell, Medtronic, Motorola, Nokia, Philips, Raytheon, Rockwell-Collins, Samsung, and Sony. Its innovative boundary-scan products provide test preparation, test execution, test result analysis and in-system programming applications. With an installed base of over 5,500 systems worldwide, JTAG Technologies serves the communications, medical electronics, avionics, defence, automotive, and consumer industries with offices throughout North America, Europe and Asia. JTAG Technologies headquarters are located in Eindhoven, The Netherlands.