Aeroflex Debuts 4520 Stand Alone Flying Probe System Fixtureless Test

Aeroflex has introduced the 4520 stand-alone Flying Probe System, a quick, easy and flexible solution to meet a variety of Printed Circuit Board (PCB) testing needs. Designed to perform high-speed, high-accuracy fixtureless test in a stand-alone platform, the Aeroflex 4520 offers users all the benefits of the popular 4550 in-line Flying Probe System, at a lower entry cost.

The Aeroflex 4520 stand-alone system combines the latest in flying probe hardware technology with innovative software techniques, shortening time-to-market with its quick program generation and flexible testing techniques.

Aeroflex 4520 stand-alone Flying Probe System for low-cost, flexible fixtureless test“Aeroflex is committed to moving our Automatic Test Equipment (ATE) line forward by continually introducing new products and new features to enhance capabilities, increase usability and add value for our customers,” said Kevin Tomkins, ATE product manager, Aeroflex Test Solutions. “The new Aeroflex 4520 stand-alone Flying Probe System meets the stringent requirements of today’s test market. Customers can count on the continued evolution of the Aeroflex 4550 line to ensure it will meet tomorrow’s needs just as efficiently.”

The Aeroflex 4520 system is ideally suited to reduce test costs per board in a low to medium-volume PCB manufacturing environment that does not require in-line test.

About the Aeroflex 4500 Series Flying Probe
The Aeroflex 4500 Flying Probe Series is a highly flexible, fixtureless test environment that provides the level of throughput required in production on a “one-stop” test platform, but flexible enough to make it ideal for prototype applications. The Aeroflex 4500 Series comprises the Aeroflex 4550 in-line and the Aeroflex 4520 stand-alone test systems. Both models offer fast and highly accurate probing, short program development times, together with advanced test techniques, such as device programming, boundary scan and functional test capability.

The Aeroflex 4500 Series features a Soft Landing Option to minimise potential damage to the unit under test (UUT) caused by probing, which is especially important in ‘safety critical’ applications common in military, automotive and medical industries. It works by allowing the probes to travel at normal speed in the Z-axis, but decelerate towards the end of their travel, avoiding potential damage to UUT.

The Partial Accessibility Option is another key feature of the Aeroflex 4500 Series. It is an automatic process that allows components to be tested, even when some of the probes cannot access specific target points due to the test subject architecture. This technique takes advantage of a further key development that enables accessibility to be maximised through the ability to automatically switch all test probe angles between 0 and 8 degrees during program execution.

The new Aeroflex 4520 stand-alone Flying Probe System is available now.

About Aeroflex
Aeroflex Incorporated is a global provider of high technology solutions to the aerospace, defence, cellular and broadband communications markets. The Company’s diverse technologies allow it to design, develop, manufacture and market a broad range of test, measurement and microelectronic products. Aeroflex Incorporated was founded in 1937 and today has more than 2,600 employees worldwide.

About Aeroflex Test Solutions, Instruments Division
Staffed with experts in RF and microwave signal generation and processing subsystems, Aeroflex Test Solutions Group provides test and measurement systems, instruments, modules, services and integration support for the communications test, military, government and semiconductor industries. Aeroflex’ solutions reflect a commitment to industry-accepted standards and the concept of modular product development. They encompass Communications test (public mobile radio, wireless cellular and telecom, military radio and avionics radio test), Signal sources (synthesizers, signal generators, signal analyzers and phase noise systems), General-purpose test (spectrum analyzers, microwave analyzers, bit error rate testers) and Systems (satellite, ATE, PXI and radar).