Verigy (NASDAQ: VRGY), a premier semiconductor test company, has introduced the Inovys[tm] Silicon Debug Solution to address the growing need for more efficient debug to accelerate time to volume production of new system-on-chip (SoC) devices. Verigy’s new solution combines the revolutionary Inovys FaultInsyte software with the scalable and flexible Verigy V93000 SoC test system. The result is an integrated solution that reduces the time required for fault detection and diagnosis by efficiently mapping electrical failures to physical defects on complex SoC devices. This significantly shortens time to debug, ramp and volume production for manufacturers using processes at 90 nanometers and below.
As complex SoCs are increasingly at the core of consumer electronic devices, product lifetimes are shrinking, leading to pressure to reduce time-to-market and leaving scant time for debug and characterization activities. At the same time, designs at and below the 90 nm process node are highly sensitive to fabrication equipment variation, leading to new defect mechanisms and fault models. In addition, at this scale, process and design interactions introduce new, complex failures and defects.
“Accelerating the detection and diagnosis of design-induced failures is essential to achieving time-to-market for complex SoC devices. At the latest process nodes, the advantage of a few weeks to market can mean millions of dollars to the designer,” said Hans-Juergen Wagner, vice president and general manager of Verigy’s Semiconductor Test Solutions. “The Inovys Silicon Debug Solution, integrated with the measurement capabilities of the V93000, provides a unique tool. Manufacturers can now find previously elusive faults while the complex SoC devices are still on the tester and without invoking expensive and time-consuming systems and processes.”
The Inovys Silicon Debug Solution seamlessly combines two proven, best-in-class solutions. The V93000 SoC test system delivers fast and accurate data collection through its large fail capture memory, measurement repeatability and per-pin architecture. The Inovys FaultInsyte technology provides revolutionary visualization and diagnostic tools with unique views into the “structural DNA” of the semiconductor device. The Silicon Debug solution can easily be added to existing V93000 Pin Scale systems. With the V93000′s large, global installed base, yield acceleration becomes widely accessible.
Verigy is currently working with early-adoption customers, and the solution will be widely available beginning November 2008.
Verigy designs, develops, manufactures, sells and services advanced semiconductor test systems and solutions for the flash memory, high-speed memory and system-on-chip (SoC) markets. Verigy’s scalable platforms are used by leading companies worldwide in design validation, characterization, and high-volume manufacturing test. Advanced analysis tools accelerate design debug and yield ramp processes for Verigy’s customers.