DAC 2008 Features AMS Tutorial, Seminar from Solido Design

Solido Design Automation, innovator of process variation solutions for transistor-level integrated circuit (IC) designers, will be demonstrating solutions to head off statistical and proximity variations in analog/mixed-signal, custom digital and memory ICs in Booth #660 at the Design Automation Conference (DAC), Anaheim Convention Center in Anaheim, California from June 8th to 13th, 2008.

Other Solido Design Automation activities at DAC include:

Variation Robustness for Analog/Mixed-Signal, Custom Digital and Memory Design
Wednesday, June 11, 2008 from 9:00am – 10:00am
Anaheim Hilton and Towers, Room: El Capitan AB
Of interest to designers, design managers, CAD managers
Presented by Patrick Drennan, Solido’s Chief Technology Officer. This seminar will include a brief review of the physical phenomena and industry standard device models for variation sources, including random local and global variations and systematic proximity effects. New techniques to accelerate, increase accuracy and derive more information from statistical variation analysis will be presented. Free; breakfast included. Please register at www.solidodesign.com/dac08_tech_seminar.shtml

Robust Analog/Mixed-signal Design
Friday, June 13, 2008 from 9:00am – 5:00pm
Anaheim Conference Center, Room 208AB
Of interest to engineers working on analog/mixed-signal/RF designs and simulation
Features Trent McConaghy, Solido’s Chief Scientific Officer, as one of four speakers. Tutorial organized by Joel Phillips of Cadence Design Systems. For more detail, see www.dac.com/events/eventdetails.aspx?id=77-132

About Solido Design Automation
Solido Design Automation Inc. provides process variation solutions for transistor-level designers of analog/mixed-signal, custom digital, and memory integrated circuits. The privately held company is venture capital funded and has offices in U.S.A., Canada, Japan and Europe. For further information, call 306-382-4100.