SyntheSys Research, Inc., introduces the new BERTScope Lightwave Test Set (LTS) 8500A – the first flexible stress solution to offer 850 nm receiver jitter tolerance testing (stressed eye) to 8x Fibre Channel and 10 Gb/s Ethernet Short Reach (10GBASE-SR) standards for transceiver types such as XFP and SFP+. In combination with the BERTScope S 12500B signal integrity analyzer, the LTS 8500A offers compliance test and deep insight on all high speed ports of common short reach optical transceivers.
The BERTScope LTS features an 850 nm optical source, and an optional 10 Gb/s optical reference receiver with defined bit rate clock recovery, enabling transmitter test and optical stress calibration. When combined with the BERTScope S 12500B, all of the stress impairments required by 1x, 2x, 4x, 8x, and 10x Fibre Channel are available, along with those of 10GBASE-SR. For the first time, engineers are able to generate a test quality 850 nm stressed eye, calibrate it at the time of test if required, and then set the desired optical modulation amplitude (OMA) using the built in output level control.
The new addition to the BERTScope solution family dovetails perfectly with the BERTScope DCRj compliance receiver with flexible clock recovery and jitter analysis, and available automation software for making waterfall measurements and calibrating 10 Gb/s Ethernet and 4x Fibre Channel stressed eyes. The LTS and DCRj are easily controlled through an intuitive user interface design on the BERTScope S 12500B analyzer, and the combination has been dubbed the BERTScope Optical Test Bench.
The BERTScope LTS 8500A 850nm Lightwave Test set is available 12 weeks ARO. It is priced in the U.S. at $49,000.
About SyntheSys Research, Inc.
Founded in 1989, SyntheSys Research, Inc., innovator of the award-winning BERTScope(TM), is a privately held corporation located in Menlo Park, California. SyntheSys develops and manufactures high-speed signal integrity test and measurement instrumentation for the computer, storage and communications industries.