Advantest to Present Three Papers at International Test Conference

Advantest Corporation (TSE: 6857, NYSE: ATE), the global leader in semiconductor test equipment, is presenting three papers in the technical program at the 38th annual International Test Conference (ITC) at the Santa Clara Convention Center (Oct. 23-25). Long active in ITC planning and in the conference itself, Advantest is also a platinum-level supporter of the conference. In addition, Advantest is a corporate sponsor of the “Automatic Test Equipment Vision 2020 Workshop,” held during Test Week on Oct. 26.

R. Keith Lee, president and CEO of Advantest America, comments, “Test Week and the International Test Conference are the pre-eminent industry events for the semiconductor ATE industry. As Advantest’s U.S. subsidiary, headquartered in Santa Clara, Advantest America welcomes ITC back to our city for the second consecutive year. It’s exciting, stimulating and extremely productive to have the international test community here to exchange ideas, enter into creative dialog and collaborate on solutions to the test industry’s challenges.”

Advantest Technical Papers At ITC
Advantest engineers and technical specialists will participate in ITC’s technical program each day of the conference:

  • Tuesday, October 23
    Paper 4.1. “Data Jitter Measurement Using a Delta-Time-to-Voltage Converter Method,” by K. Ichiyama, M. Ishida, T. Yamaguchi, Advantest Laboratories; and M. Soma, University of Washington. This paper discusses how real-time jitter measurement on arbitrary data can be accomplished at low cost.
  • Wednesday, October 24
    Paper 16.3. “A Low-Cost FFT-based Jitter Separation Method for High-Frequency Clock Testing,” by T. Yamaguchi, M. Ishida, Advantest Laboratories; H. Hou, D. Armstrong, Advantest America; and M. Soma, University of Washington. This paper describes how to perform an FFT on jitter’s PDF to get clean separation of RJ and DJ much faster than with other techniques and with fewer sampling constraints.
  • Thursday, October 25
    Paper 28.2. “An Algorithm to Evaluate Wideband Quadrature Mixers,” by K. Asami, Advantest Corporation. Mr. Asami will describe how to evaluate gain imbalance, phase offset and skew of a quadrature modulator with a single measurement and without the use of advanced calibration schemes in order to reduce production test time.

Discussing the Future of ATE
In addition to being a Platinum-level corporate supporter of the three-day conference, Advantest is a corporate sponsor of the workshop, “Automatic Test Equipment Vision 2020.” Registration, reception, the keynote and a panel will be held on Thursday, Oct 25, 4-6:30 p.m., and the workshop will be held on Friday, Oct. 26, 8 a.m.- 4 p.m. The workshop will examine topics such as Known-Good-Die (KGD) quality levels and the more complex failure modes challenging yield learning curves; increasing cost of test, time-to-volume and time-to-market pressures, and other challenges in light of existing ATE roadmaps. As a workshop presenter, Paul Roddy of Advantest will speak about open test architectures and industry collaboration.

About Advantest
Advantest Corporation is the global leader in automatic test equipment to the semiconductor industry. Advantest’s SoC, logic, memory, mixed-signal and RF testers and device handlers are integrated into the most advanced semiconductor fabrication lines in the world. Founded in Tokyo in 1954, Advantest established its North American subsidiary in 1982 and its European subsidiary in 1984.