Xilinx to Attend IEEE Nuclear and Space Radiation Effects Conference

Xilinx, Inc. (NASDAQ:XLNX) announced that its industry-leading programmable logic solutions for enabling space applications, will be showcased at the 2007 IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 23-27, 2007 in Honolulu, Hawaii. Xilinx in-booth demonstration and technology presentations are available for show registered attendees throughout the conference.

Booth Demonstration – Xilinx TMRTool
Demonstration of the industry’s first Triple Modular Redundancy development tool for reconfigurable Xilinx(R) Virtex(TM) FPGA design.

Technical Papers Highlighting Xilinx Technology

Tuesday, July 24

  • Domain Crossing Events: Limitations on Single Device Triple-Modular Redundancy Circuits in Xilinx FPGAs (C-5)
    H. Quinn, K. Morgan, P. Graham, J. Krone, M. Caffrey, Los Alamos National Laboratory; K. Lundgren, Brigham Young University
  • Risk Reduction for Use of Complex Devices in Space Projects (PD-2)
    M. Berg, C. Poivey, MEI Technologies, Inc., NASA-GSFC; D. Petrick, K. LaBel, M. Friendlich, S. Stansberry, NASA-GSFC

Wednesday, July 25

  • Upset Characterization and Test Methodology of the PowerPC405 Hard-Core Processor Embedded in Xilinx Field Programmable Gate Arrays (W-29)
    G. Allen, G. Swift, JPL; G. Miller, Xilinx
  • Dose Rate Upset Investigations on the Xilinx Virtex-4 Field Programmable Gate Arrays (W-30)
    A. Vera, D. Llamocca, M. Pattichis, University of New Mexico; W. Kemp, W. Sheed, D. Alexander, J. Lyke, Air Force Research Laboratory
  • Static Proton and Heavy Ion Testing of the Xilinx Virtex-5 Device (W-31)
    H. Quinn, K. Morgan, P. Graham, J. Krone, M. Caffrey, Los Alamos National Laboratory; K. Lundgren, Brigham Young University

Thursday, July 26

  • Experimental Validation of a Tool for Predicting the Effects of Soft Errors in SRAM-based Field Programmable Gate (PJ-8)
    L. Sterpone, M. Violante, Politecnico di Torino; R. Harboe-Sørensen, D. Merodio, F. Sturesson, R. Weigand, European Space Agency; S. Mattsson, Saab Ericsson Space
  • A Comparison of TMR with Alternative Fault Tolerant Design Techniques for FPGAs (PC-3)
    K. S. Morgan, Los Alamos National Laboratory; D. L. McMurtrey, B. H. Pratt, M. J. Wirthlin, Brigham Young University
  • Experimental Validation of a Tool for Predicting the Effects of Soft Errors in SRAM-based Field Programmable Gate (PJ-8)
    L. Sterpone, M. Violante, Politecnico di Torino; R. Harboe-Sørensen, D. Merodio, F. Sturesson, R. Weigand, European Space Agency; S. Mattsson, Saab Ericsson Space

IEEE Nuclear and Space Radiation Effects Conference
Hilton Hawaiian Village, Honolulu, Hawaii Booth # 107
July 23 – July 27, 2007
Exhibits: Tuesday, July 24 – 10:15 a.m. – 3:30 p.m. | 6:00 – 10:00 p.m.
Wednesday, July 25 – 7:30 a.m. – 2:45 p.m.

About Xilinx Aerospace and Defense
Xilinx is the worldwide leader in complete programmable logic solutions providing uninterrupted support to the Aerospace and Defense (A&D) community since 1989. Comprehensive solutions include commercial grade to radiation tolerant field programmable gate arrays (FPGAs), A&D focused intellectual property (IP) for applications from image processing to waveform generation, and advanced technology such as partial reconfiguration and Single Chip Crypto. Xilinx offers long product lifecycles, high reliability devices, unique manufacturing flows, specialized design services, and advanced security solutions for High Assurance applications to support the long term program needs of the A&D industry.