Archive for April 2007

Leading Publications Honor Microchip Technology

Posted by EDA Geek News Staff in Other on Friday, April 27, 2007

Microchip Technology Inc., a leading provider of microcontroller and analog semiconductors, announced that it has been recognized by several electronics magazines and a prominent Arizona business publication for product and organizational leadership, along with recognition for strong employee contributions from a major charity.

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Agilent Doubles Throughput with 3D X-Ray Inspection System

Posted by EDA Geek News Staff in Test Solution on Friday, April 27, 2007

Agilent Technologies Inc. (NYSE:A) announced a breakthrough for in-line 3D X-ray inspection systems that detect printed circuit board assembly (PCBA) solder and manufacturing assembly defects. The Agilent Medalist x6000 AXI reduces customers' manufacturing conversion costs without compromising defect-detection capability. It accomplishes this by more than doubling the throughput of market-leading 3D solutions while using full 3D capability to find defects.

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Advantest Creates Dynamic Test Handler for Memory Devices

Posted by EDA Geek News Staff in Test Solution on Friday, April 27, 2007

Advantest Corporation (TSE: 6857)(NYSE: ATE), announced the launch of its new dynamic test handler, the M6241, for memory devices such as DDR2/3-SDRAM. It offers parallel test for up to 512 devices and boasts a throughput of 20,000 units per hour. Its compact design and new features, including an advanced heating mechanism to increase thermal stability, combine to offer significant cost reductions for volume production of today's multi-purpose memory devices. Furthermore, with improved device transfer mechanisms, the M6241 slashes test process time and jam rates, enabling more efficient testing and greater yields.

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National Semiconductor Debuts Sub-Nanosecond Comparator

Posted by EDA Geek News Staff in Components on Friday, April 27, 2007

National Semiconductor Corporation (NYSE: NSM), a leading supplier of high-performance analog signal-path products, introduced the LMH7322, a dual comparator that provides the industry's lowest power (21 mA typical) with sub-nanosecond (700 ps) propagation delay. The LMH7322 joins the LMH7220 single comparator as part of a new family of single, dual and quad high-speed comparators that feature low-voltage differential signaling (LVDS) and reduced-swing positive emitter-coupled logic (RSPECL) outputs. National will begin sampling a quad comparator with similar specifications to the LMH7322 in fall 2007.

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IMEC Maintains Leadership Position in Nanoelectronics Research

Posted by EDA Geek News Staff in Research on Friday, April 27, 2007

During a recent General Assembly, the IMEC Board confirms that 2006 was an excellent year at all levels. IMEC was able to maintain its position as a leading nanoelectronics research institute and is constantly adapting to the changing semiconductor landscape to offer research programs the industry needs.

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ST Ranks First in Serial EEPROM Market

Posted by EDA Geek News Staff in Components on Friday, April 27, 2007

STMicroelectronics (NYSE: STM) announced continued worldwide leadership of the Serial EEPROM market in 2006 – the third successive year – according to market intelligence organization iSuppli*. The iSuppli analysis reports ST with a 2006 market share of 25%, substantially ahead of its nearest competitor, and an increase in sales value of 17.8% despite falling prices. Products contributing to the $278 million sales total include Serial EEPROM devices, memory cards, and RFID tags.

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