Aeroflex Adds New Features to ATE Systems

At NEPCON 2007 (Hall 1, Stand M50), Aeroflex will launch a range of new capabilities and enhancements for its 5800 multi-configuration, multi-function test system, 4550 flying probe test system and 4250 advanced manufacturing test system. The Aeroflex 5800 multi-configuration, multi-function ATE system will be enhanced with a new digital functional test capability targeting digital functional test applications, mixed signal testing and in-system device programming. The new digital system is based on a Digital Test Controller board and up to 18 Digital Testpoint boards giving a maximum digital functional testpoint count of 1152 un-multiplexed I/O channels.

The Aeroflex 5800 series ATE system is a highly flexible, scalable and modular test environment designed to provide the true re-configurability needed to meet the ever-changing requirements of the rapidly evolving PCB industry. It features an open hardware and software architecture and reconfigurable pinface styles to give users the ability to combine digital system testing, low-cost analogue in-circuit testing with a maximum of 3456 test points, high integrity functional testing and systems test all within a single test environment.

Aeroflex ATE productsAeroflex will be announcing the addition of soft landing and partial accessibility capabilities to its 4550 flying probe ATE system. The soft landing technique is designed to minimise the potential damage to the ‘unit under test’ caused by probing. The partial accessibility capability allows components to be tested even when some of the probes cannot access specific target test points due to component heights or board congestion.

With its ability to perform advanced test techniques including boundary scan, device programming and functional test through an integrated software environment, the Aeroflex 4550 flying probe test system is ideal for prototype applications and also provides the level of throughput required in a production environment. At 30% faster and lower-cost than Aeroflex’s previous generation flying probe system, the 4550′s improved probing speed results in greatly enhanced testing throughput which is achieved without compromising probing accuracy and repeatability or the high levels of test coverage made possible by targeting access points down to 75µm.

Aeroflex will announce improved boundary scan and device programming capabilities for its flagship 4250 advanced manufacturing ATE system by providing support for JTAG Technologies’ JT37x7 range of controllers.

The Aeroflex 4250 offers a compact small-footprint design that can be equipped with a maximum of 2048 pure (non-multiplexed) test points. It provides fast and efficient testing of a wide range of printed circuit boards using analog and digital in-circuit, boundary scan and functional techniques. With a test speed second to none, its throughput is guaranteed to generate cost savings in any manufacturing environment.

About Aeroflex
Aeroflex Incorporated is a global provider of high technology solutions to the aerospace, defence, cellular and broadband communications markets. The Company’s diverse technologies allow it to design, develop, manufacture and market a broad range of test, measurement and microelectronic products. The Company’s common stock trades on the Nasdaq National Market System under the symbol ARXX and is included in the S&P SmallCap 600 index.

About Aeroflex Test Solutions, Instruments Division
Staffed with experts in RF and microwave signal generation and processing subsystems, Aeroflex Test Solutions Group provides test and measurement systems, instruments, modules, services and integration support for the communications test, military, government and semiconductor industries. Aeroflex’ solutions reflect a commitment to industry-accepted standards and the concept of modular product development. They encompass Communications test (public mobile radio, wireless cellular and telecom, military radio and avionics radio test), Signal sources (synthesizers, signal generators, signal analyzers and phase noise systems), General-purpose test (spectrum analyzers, microwave analyzers, bit error rate testers) and Systems (satellite, ATE, PXI and radar).