Agilent Technologies Inc. (NYSE:A) announced the availability of the Agilent Medalist i3070 in-circuit test system for printed circuit board assembly. For electronics manufacturers around the world, this system is the fastest, easiest way to bring the power of in-circuit test to the production line.
Advanced algorithms provide analog test throughput increase by up to 50 percent compared with legacy Agilent Medalist 3070 systems. Simple graphical user interfaces are designed to maximize ease-of-use for operators in the fast-paced high-volume manufacturing environment.
The Agilent Medalist i3070 includes another industry first — VTEP v2.0 vectorless test technology that incorporates the new Network Parameter Measurement technology targeted at defect detection on power and ground pins for connectors.
Power and ground pins have long been considered off limits to vectorless test because, by design, the power or ground pins are tied together, making an opening in a pin virtually undetectable in any of the currently available vectorless test solutions in the market. Agilent’s VTEP v2.0 is the innovative solution to overcome this test limitation.
“The Medalist i3070 enables our customers to develop and debug their programs quicker than before,” said NK Chari, ICT marketing manager of Agilent’s Measurement Systems Division. “We’ve also made vast improvements on the throughput and have achieved unprecedented coverage with VTEP v2.0. We have pushed the boundaries on the most flexible and industry-leading in-circuit test platform, and are helping customers improve their time-to-market, reduce their cost and protect their investments.”
Both the new Medalist i3070 and VTEP v2.0 capabilities can be enabled on existing Medalist ICT systems with a simple software upgrade. Concurrently, to further protect the investment of existing Agilent Medalist 3070 and i5000 users, the new Medalist i3070 provides a high degree of compatibility with the legacy Agilent ICT systems, making it effortless for end-users to transport across systems with the same configuration.
U.S. Pricing and Availability
The Agilent Medalist i3070 system is available starting March 2007. The system is can be seen in Booth No. 2213 at Apex 2007, Feb. 20 – 22, at the Los Angeles Convention Center, Calif.
About the Agilent Medalist ICT Family
The Agilent Medalist In-Circuit Test (ICT) family solves real-world problems for electronics manufacturers by providing industry-leading flexibility in ICT. The family features a scalable architecture in one-, two- and four-module configurations to solve the widest variety of priorities on the production floor. Compatible design and proven ICT technology provide a level of test transportability, stability and repeatability that is unmatched in the industry, providing total freedom to migrate tests across systems, production lines and sites with no compromise in measurement accuracy.
About Agilent Technologies
Agilent Technologies (NYSE:A) is the world’s premier measurement company and a technology leader in communications, electronics, life sciences and chemical analysis. The company’s 19,000 employees serve customers in more than 110 countries. Agilent had net revenue of $5.0 billion in fiscal 2006.