Teradyne, LogicVision Integrate Silicon Diagnostic Solutions with IG-XL OS

Teradyne, Inc. (NYSE:TER) and LogicVision, Inc. (NASDAQ: LGVN) announced that they have established seamless interaction between LogicVision’s ETAccess(TM) semiconductor diagnostic products and Teradyne UltraFLEX(TM) test systems. Teradyne’s Test Assistance Group (TAG) and LogicVision jointly engineered the new software interface that enables users easy access to LogicVision’s embedded memory and logic built-in self-test (BIST) device structures.

Through the IG-XL(TM) operating system environment, UltraFLEX and ETAccess users can test and debug devices more rapidly, improving final test yield and further lowering the cost of test. Joint collaborations are anticipated to include additional releases of IG-XL software for the FLEX(TM) Test Platform and the J750 Test System.

Teradyne’s Test Assistance Group (TAG) is a dedicated resource for getting customer’s products to market faster. TAG and LogicVision teamed together to engineer the production enhancing interface between UltraFLEX and ETAccess. LogicVision’s ETAccess product is an interactive environment that captures test information to identify and analyze device failures for dramatically improved silicon diagnostic and device test ramp-up time.

“ETAccess provides a comprehensive environment for device test data logging and analysis,” said Farhad Hayat, Vice President, Marketing, LogicVision. “Interfacing our technology seamlessly to Teradyne’s IG-XL-based test platform allows our joint customers to quickly bring up and debug their devices in real-time on the production floor to maximize test quality and lower overall cost of test.”

“In just a few minutes, our customers can make a standard test program production ready with LogicVision tools. The Windows-based IG-XL software environment makes interfacing to the LogicVision software easy. Teradyne and LogicVision have a history of creating integrated solutions and this interface is an excellent example of our commitment to increasing productivity for our customers,” said Bill Wyckoff, Teradyne US-West Test Assistance Group (TAG) Manager.

About LogicVision Inc.
LogicVision, Inc. (NASDAQ: LGVN) provides unique test and yield learning capabilities in the design for manufacturing space. These capabilities enable its customers, leading semiconductor companies, to more quickly and efficiently learn to improve product yields. The company’s advanced Design for Test (DFT) product line, ETCreate, works together with ETAccess and Yield Insight yield learning applications to improve profit margins by reducing device field returns, reducing test costs, and accelerating both time to market and time to yield. LogicVision solutions are used in the development of semiconductor ICs for products ranging from digital consumer goods to wireless communications devices and satellite systems. LogicVision was founded in 1992 and is headquartered in San Jose, Calif.

About Teradyne
Teradyne (NYSE:TER) is a leading supplier of Automatic Test Equipment used to test complex electronics used in the consumer electronics, automotive, computing, telecommunications, and aerospace and defense industries. In 2005, Teradyne had sales of $1.08 billion, and currently employs about 3,900 people worldwide.

Teradyne(R), FLEX, IG-XL, and UltraFLEX are trademarks or registered trademarks of Teradyne, Inc. in the US and other countries. All other trademarks are the property of their respective owners. LogicVision, ETAccess and LogicVision logos are trademarks or registered trademarks of LogicVision Inc. in the United States and other countries.